Precision Multiferroic II是市面上进的铁电测试系统。具有*特的频率等级270khz在+ / - 100V的内置系统,实现对薄膜和块体陶瓷快速而简单的测试。
Premier Multiferroic II*改变测试样品的连接,即可实现滞回,脉冲,漏电,IC,IV的测试。配备额外的模块,可实现热释电性能、磁电特性、晶体管特性、低温性能、块体陶瓷和/或薄膜压电性能的测试。
Precision Multiferroic II提供了多种内部放大器,±100V/200V/500v内置驱动电压的可供选择。可外置扩展10KV的高压接口和一个放大器。系统包括可视化数据采集和管理系统软件。
可实现的测试功能:
1.电滞回线测试;
2.记忆特性测试;
3.漏电流测试;
4.疲劳测试;
5.脉冲测试;
6.IV测试;
7.CV测试保持力测试;
8.印痕测试;
备注:另外还有压电测试、热释电测试、磁电测试需配合另外升级选件实现。
Tester Parameter | Multiferroic II |
Voltage Range (built-in drive voltage) | ±10V, ±30V, ±100V, ±200V or ±500V built-in |
Voltage Range with an external amplifier and high voltage interface (HVI) | 10KV |
Number of ADC Bits | 18 |
Minimum Charge Resolution | 0.80fC |
Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2) | 0.080μ2 |
Maximum Charge Resolution | 5.26mC |
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) | 52.6cm2 |
Maximum Charge Resolution with High Voltage Interface (HVI) | 526mC |
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI | >100cm2 |
Maximum Hysteresis Frequency | 270KHz @ 10V |
270KHz @ 30V | |
270KHz @ 100V | |
100KHz @ 200V | |
5KHz @ 500V | |
Minimum Hysteresis Frequency | 0.03Hz |
Minimum Pulse Width | 0.5μs |
Minimum Pulse Rise Time (5V) | 400ns |
Maximum Pulse Width | 1s |
Maximum Delay between Pulses | 40ks |
Internal Clock | 25ns |
Minimum Leakage Current (assuming max current integration period = 1 seconds) | 1pA |
Maximum Small Signal Cap Frequency | 1MHz |
Minimum Small Signal Cap Frequency | 1Hz |
Output Rise Time Control | 105 scaling |
Input Capacitance | -6fF |
Electrometer Input All Test Frequencies for all test at any speed | Yes |
* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance. | |
*** Tester specifications are subject to change without notice. |